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SNJ54ABT8646JT

零件编号 SNJ54ABT8646JT
产品分类 专业逻辑
制造商 Texas Instruments
描述 SCAN TEST DEVICES WITH OCTAL BUS
封装
包装 管子
数量 0
RoHS 状态 YES
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产品参数
PDF(1)
类型描述
制造商Texas Instruments
系列54ABT
包装管子
产品状态ACTIVE
包装/箱28-CDIP (0.300", 7.62mm)
安装类型Through Hole
位数8
逻辑类型Scan Test Device with Bus Transceiver and Registers
工作温度-55°C ~ 125°C
电源电压4.5V ~ 5.5V
供应商设备包28-CDIP

Roving Networks (Microchip Technology)
MEMS OSC XO 133.0000MHZ CMOS SMD
Roving Networks (Microchip Technology)
MEMS OSC XO 24.5760MHZ CMOS SMD
Roving Networks (Microchip Technology)
MEMS OSC XO 100.0000MHZ LVPECL
Roving Networks (Microchip Technology)
MEMS OSC XO 125.0000MHZ LVPECL
Roving Networks (Microchip Technology)
MEMS OSCILLATOR, ULTRA LOW POWER
Roving Networks (Microchip Technology)
MEMS OSC XO 133.3330MHZ CMOS SMD
Roving Networks (Microchip Technology)
MEMS OSC XO 175.0000MHZ LVDS SMD
Roving Networks (Microchip Technology)
MEMS OSC LOW JITTER 125MHZ LVDS
Roving Networks (Microchip Technology)
MEMS OSC XO 32.0000MHZ CMOS SMD
Roving Networks (Microchip Technology)
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